METHODS OF MEASUREMENT FOR SEMICONDUCTOR LOGIC GATING MICROCIRCUITS
半导体逻辑门控微电路的测量方法
发布日期:
1970-01-01
本公告中的选通逻辑和选通逻辑所用的二进制逻辑表示的信息。包括静态和动态测量。
The purpose of this bulletin is to recommend for use in the rating of semiconductor logic gating microcircuits which use the binary states to represent and process logic information. Both static and dynamic measurements are covered.