IEC 60747的本部分规定了无透镜CMOS光子阵列传感器封装模块的评估过程。本文件包括每个工艺的测量环境、测试数据的统计分析、各种用户光下的中间层效应、校准的无透镜CMOS光子阵列传感器封装模块的评估，以及测试报告。交叉引用:IEC 60747-18-1:2019IEC 60749（所有部分）IEC 60747-1IEC 60747-14-5IEC 60747-14-1购买本文件时可获得的所有现行修订均包含在购买本文件中。

This part of IEC 60747 specifies the evaluation process of lens-free CMOS photonic array sensor package modules. This document includes the measurement environment of each process, statistical analysis of test data, middle layer effect under various user light, evaluation of calibrated lens-free CMOS photonic array sensor package modules, and test report.Cross References:IEC 60747-18-1:2019IEC 60749 (all parts)IEC 60747-1IEC 60747-14-5IEC 60747-14-1All current amendments available at time of purchase are included with the purchase of this document.