Semiconductor devices. Semiconductor interface for automotive vehicles-Evaluation method of data interface for automotive vehicle sensors
半导体器件 汽车用半导体接口
发布日期:
2018-08-30
BS EN IEC 62969-4:2018规定了汽车发动机直接故障注入试验的方法
半导体传感器接口,可用于支持
车辆通信接口。交叉引用:IEC 60050-442IEC 60050-161IEC 60050-722购买时可用的所有现行修订版均包含在本文件的购买中。
BS EN IEC 62969-4:2018 specifies a method of directly fault injection test for automotive
semiconductor sensor interface that can be used to support the conformance assurance in the
vehicle communications interface.Cross References:IEC 60050-442IEC 60050-161IEC 60050-722All current amendments available at time of purchase are included with the purchase of this document.