Semiconductor devices-Semiconductor sensors. Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature
半导体器件
This part of IEC 60747 defines the terms, definitions, configuration, and test methods can be
used to evaluate and determine the performance characteristics of surface acoustic wavebased
semiconductor sensors integrated with ultraviolet, illuminance, and temperature sensors.
The measurement methods are for DC characteristics and RF characteristics, and the
measurement method for RF characteristics includes a direct mode and differential amplifier
mode based on feedback oscillation. This document excludes devices dealt with by TC 49:
piezoelectric, dielectric and electrostatic devices and associated materials for frequency control,
selection and detection.All current amendments available at time of purchase are included with the purchase of this document.