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现行 MIL MIL-PRF-19500/657C
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Semiconductor Device, Field Effect, Radiation Hardened, Transistor Die, N and P-Channel, Silicon Various Types JANHC and JANKC 半导体器件 场效应 抗辐射 晶体管管芯 N沟道和P沟道 硅各种类型的JANHC和JANKC
发布日期: 2020-03-10
MIL-PRF-19500/657C涵盖了N和P沟道、增强模式、MOSFET、抗辐射、功率晶体管管芯的性能要求。按照MIL-PRF-19500的规定,每种设备类型都有两级产品保证。
MIL-PRF-19500/657C covers the performance requirements for N and P-channel, enhancement-mode, MOSFET, radiation hardened, power transistor die. Two levels of product assurance are provided for each device type as specified in MIL-PRF-19500.
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发布单位或类别: 美国-美国军事规范和标准
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现行
MIL MIL-PRF-19500/657B Notice 1-Validation 1
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半导体器件 场效应 辐射硬化(总剂量和单事件效应)晶体管管芯 N沟道和P沟道 硅 各种类型 JANHC和JANKC
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现行
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现行
MIL MIL-PRF-19500/741B Amendment 1
Semiconductor Device, Field Effect, Radiation Hardened (Total Dose and Single Event Effects) Transistor Die, N-Channel and P-Channel, Silicon, Various Types, JANHC and JANKC
半导体器件 场效应 辐射硬化(总剂量和单事件效应)晶体管管芯 N沟道和P沟道 硅 各种类型 JANHC和JANKC
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MIL MIL-PRF-19500/633D Notice 1-Validation 1
Semiconductor Device, Field Effect Radiation Hardened Transistors, P-Channel Silicon, Types 2N7403 and 2N7404, JANSD and JANSR
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MIL MIL-PRF-19500/633E
Semiconductor Device, Field Effect Radiation Hardened Transistors, P-Channel Silicon, Types 2N7403 and 2N7404, JANSD and JANSR
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MIL MIL-PRF-19500/657A Notice 1-Validation 1
SEMICONDUCTOR DEVICE, FIELD EFFECT, RADIATION HARDENED, TRANSISTOR DIE, N AND P-CHANNEL, SILICON VARIOUS TYPES JANHC AND JANKC (SUPERSEDING MIL-PRF-19500/657)
半导体器件 场效应 辐射硬化 晶体管管芯 N和P沟道 硅各种类型JANHC和JANKC(取代MIL-PRF-19500/657)
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MIL MIL-PRF-19500/638B Notice 2-Validation
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MIL MIL-PRF-19500/639A Notice 3-Validation
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Semiconductor Device, Field Effect Radiation Hardened (Total Dose and Single Event Effects)Transistor, P-Channel Silicon Type 2N7411 JANSD and JANSR
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MIL MIL-PRF-19500/704F Amendment 1
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