Semiconductor devices. Hot carrier test on MOS transistors
半导体器件 MOS晶体管的热载流子测试

2010-07-31

Semiconductor devices - Hot carrier test on MOS transistors
半导体器件 - Mos晶体管上的热载体测试

2010-04-26

Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
半导体器件 金属氧化物半导体场效应晶体管（MOSFET）的移动离子试验

2010-06-30

Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
半导体器件 - 金属氧化物半导体场效应晶体管（mosfets）的移动离子测试

2010-04-22

Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010); German version EN 62416:2010
半导体器件.MOS晶体管的热载流子试验（IEC 62416-2010）；德文版EN 62416:2010

2010-12-01

Semiconductor devices - Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Part 1: Fast BTI test for MOSFET
半导体器件.金属氧化物半导体场效应晶体管（MOSFET）的偏压温度稳定性试验.第1部分:MOSFET的快速BTI试验

2020-07-15

Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 1: Test method for bias temperature instability
半导体器件碳化硅分立金属氧化物半导体场效应晶体管可靠性试验方法第1部分:偏置温度不稳定性试验方法

2022-04-21

Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010); German version EN 62417:2010
半导体器件.金属氧化物半导体场效应晶体管（MOSFET）的移动离子试验（IEC 62417-2010）；德文版EN 62417:2010

2010-12-01

Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 2: Test method for bipolar degradation due to body diode operation
半导体器件.碳化硅分立金属氧化物半导体场效应晶体管的可靠性试验方法.第2部分:由体二极管操作引起的双极退化的试验方法

2022-05-11