Surface chemical analysis — Guidelines for preparation and mounting of specimens for analysis
表面化学分析——分析用试样的制备和安装指南
发布日期:
2005-08-22
ISO 18116:2005给出了即将进行表面化学分析的试样的安装和表面处理方法指南。它旨在帮助分析员了解通过俄歇电子能谱、二次离子质谱和X射线光电子能谱等技术进行分析所需的特殊样品处理条件。
ISO 18116:2005 gives guidance on methods of mounting and surface treatment for a specimen about to undergo surface chemical analysis. It is intended for the analyst as an aid in understanding the specialized specimen-handling conditions required for analyses by techniques such as Auger electron spectroscopy, secondary-ion mass spectrometry, and X-ray photoelectron spectroscopy.