现行

GB/T 6624-2009

硅抛光片表面质量目测检验方法
Standard method for measuring the surface quality of polished silicon slices by visual inspection

2009-10-30

现行

GB/T 6618-2009

硅片厚度和总厚度变化测试方法
Test method for thickness and total thickness variation of silicon slices

2009-10-30

现行

GB/T 6620-2009

硅片翘曲度非接触式测试方法
Test method for measuring warp on silicon slices by noncontact scanning

2009-10-30

现行

GB/T 13388-2009

硅片参考面结晶学取向X射线测试方法
Method for measuring crystallographic orientation of flats on single-crystal silicon slices and wafers by X-ray techniques

2009-10-30

现行

ASTM D8211-24a

Standard Test Method for Hot Surface Ignition Temperature of Gases on Flat Surface
平坦表面上气体热表面着火温度的标准试验方法

2024-11-01

现行

GB/T 32278-2015

碳化硅单晶片平整度测试方法
Test methods for flatness of monocrystalline silicon carbide wafers

2015-12-10

现行

SJ/T 10858-1996

玻璃及铬版表面平整度的测试方法
Test methods for surface flatness of glass substrate and chromium film

1996-11-20

现行

GB/T 29505-2013

硅片平坦表面的表面粗糙度测量方法
Test method for measuring surface roughness on planar surfaces of silicon wafer

2013-05-09

现行

GB/T 19921-2018

硅抛光片表面颗粒测试方法
Test method for particles on polished silicon wafer surfaces

2018-12-28

现行

ASTM F386-17(2022)

Standard Test Method for Thickness of Resilient Flooring Materials Having Flat Surfaces
平面弹性地板材料厚度的标准试验方法

2022-06-01

现行

GB/T 31378-2015

平板显示器（FPD）偏光膜表面硬度的测试方法
Test method for surface hardness of flat panel display (FPD) polarizing film

2015-02-04

现行

SJ/T 11631-2016

太阳能电池用硅片外观缺陷测试方法
Test methods for surface defects of silicon wafers for solar cell

2016-04-05

现行

GB/T 13387-2009

硅及其它电子材料晶片参考面长度测量方法
Test method for measuring flat length wafers of silicon and other electronic materials

2009-10-30

现行

GB/T 19922-2005

硅片局部平整度非接触式标准测试方法
Standard test methods for measuring site flatness on silicon wafers by noncontact scanning

2005-09-19

现行

GB/T 36952-2018

平板显示器（FPD）偏光膜表面耐划伤性的测试方法
Test method for surface scratch resistance of flat panel display（FPD）polarizing film

2018-12-28

现行

GB/T 40279-2021

硅片表面薄膜厚度的测试 光学反射法
Test method for thickness of films on silicon wafer surface—Optical reflection method

2021-08-20

现行

SJ/T 11504-2015

碳化硅单晶抛光片表面质量的测试方法
Test method for measuring surface quality of polished monocrystalline silicon carbide

2015-04-30

现行

BS EN 29885-1994

Wide-mouth glass containers. Deviation from flatness of top sealing surface. Test methods
宽口玻璃容器 顶部密封面平整度偏差 测试方法

1994-07-15

现行

GB/T 37854-2019

广口玻璃容器　封合面平面度偏差　试验方法
Wide-mouth glass containers—Deviation from flatness of top sealing surface—Test methods

2019-08-30

现行

GOST ISO 9885-2013

Тара стеклянная с широкой горловиной. Отклонение от плоскостности укупорочной поверхности венчика горловины. Методы испытания
广口玻璃容器 与顶部密封面的平直度偏离 测试方法

2013-03-25