IEC 62132-8:2012-集成电路 - 电磁抗扰度测量 - 第8部分:辐射抗扰度测量 - IC带状线法-国家数字标准馆

现行 IEC 62132-8:2012

到馆阅读

收藏跟踪

购买正版

Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method 集成电路 - 电磁抗扰度测量 - 第8部分:辐射抗扰度测量 - IC带状线法

发布日期： 2012-07-06

IEC 62132-8:20 12规定了一种用于测量集成电路(IC)在150kHz至3GHz频率范围内对射频(RF)辐射电磁干扰的抗扰度的方法。
本出版物应与IEC 62132-1:20 06一起阅读。

IEC 62132-8:2012 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances over the frequency range of 150 kHz to 3 GHz.

This publication is to be read in conjunction with IEC 62132-1:2006.

分类信息

发布单位或类别：国际组织-国际电工委员会

ICS分类： 31.200电子学 - 集成电路、微电子学

关联关系

研制信息

归口单位： TC 47/SC 47A

相似标准/计划/法规

GB/T 42968.8-2023

集成电路电磁抗扰度测量第8部分：辐射抗扰度测量 IC带状线法
Integrated circuits—Measurement of electromagnetic immunity—Part 8: Measurement of radiated immunity—IC stripline method

BS 09/30191126 DC

BS EN 62132-8. Integrated circuits. Measurement of electromagnetic immunity. Part 8. Measurement of radiated immunity. IC Stripline method
英国标准EN 62132-8 集成电路电磁抗扰度的测量第八部分辐射抗扰度的测量集成电路带线法

IEC TS 62132-9-2014

Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method
集成电路电磁抗扰度测量第9部分:辐射抗扰度测量表面扫描法

BS EN 62132-8-2012

Integrated circuits. Measurement of electromagnetic immunity-Measurement of radiated immunity. IC stripline method
集成电路电磁抗扰度的测量

Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method (IEC 62132-8:2012); German version EN 62132-8:2012
集成电路.电磁抗扰度的测量.第8部分:辐射抗扰度的测量.集成电路带状线法（IEC 62132-8-2012）；德文版EN 62132-8:2012

BS EN 62132-1-2016

Integrated circuits. Measurement of electromagnetic immunity-General conditions and definitions
集成电路电磁抗扰度的测量

IEC 62132-1-2015

Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
集成电路 - 电磁抗扰度测量 - 第1部分:一般条件和定义

GB/T 42968.1-2023

集成电路电磁抗扰度测量第1部分：通用条件和定义
Integrated circuits—Measurement of electromagnetic immunity—Part 1: General conditions and definitions

DIN IEC 62132-8-DRAFT

Draft Document - Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC Stripline method (IEC 47A/811/CD:2009)
文件草案——集成电路——电磁抗扰度测量——第8部分:辐射抗扰度测量——IC带状线法（IEC 47A/811/CD:2009）

IEC 62132-2-2010

Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
集成电路 - 电磁抗扰度测量 - 第2部分:辐射抗扰度测量 - 温度计和宽带电池法

GB/T 42968.2-2024

集成电路电磁抗扰度测量第2部分：辐射抗扰度测量 TEM小室和宽带TEM小室法
Integrated circuits—Measurement of electromagnetic immunity—Part 2: Measurement of radiated immunity—TEM cell and wideband TEM cell method

BS EN 62132-2-2011

Integrated circuits. Measurement of electromagnetic immunity-Measurement of radiated immunity. TEM cell and wideband TEM cell method
集成电路电磁抗扰度的测量

DIN IEC/TS 62132-9

Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method (IEC/TS 62132-9:2014)
集成电路电磁抗扰度测量第9部分:辐射抗扰度测量表面扫描法（IEC/TS 62132-9-2014）

IEC 61967-8-2023 RLV

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
集成电路.电磁发射的测量.第8部分:辐射发射的测量.IC带状线法

IEC 61967-8-2023

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
集成电路.电磁发射的测量.第8部分:辐射发射的测量.IC带状线法

BS 12/30268333 DC

BS EN 62132-1. Integrated circuits. Measurement of electromagnetic immunity. General conditions and definitions
英国标准EN 62132-1 集成电路电磁抗扰度的测量一般条件和定义

IEC 62132-5-2005

Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method
集成电路 - 电磁抗扰度测量 150 Khz至1 Ghz - 第5部分:工作台法拉第笼式

BS EN 62132-5-2006

Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz-Workbench Faraday cage method
集成电路电磁抗扰度测量 150 kHz至1 GHz

IEC 62132-4-2006

Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
集成电路 - 电磁抗扰度测量150 Khz至1 Ghz - 第4部分:直接Rf功率注入法

BS EN 62132-4-2006

Integrated circuits. Measurement of electromagnetic immunity. 150 kHz to 1 GHz-Direct RF power injection method
集成电路电磁抗扰度的测量 150千赫至1千兆赫

《国家标准化发展纲要》提出建设国家数字标准馆，推动标准化工作向数字化、网络化、智能化转型。中国标准化研究院正在全力推进国家数字标准馆建设，力争在2026年底建成“一个中心”和“一个平台”，即全球领先的标准数据资源中心，涵盖标准全生命周期的数字化、网络化、智能化研究与服务平台。

专题数据库

标准管理系统

大数据分析系统

标准智能研制系统