现行

KS D ISO 17973(2016 Confirm)

표면 화학 분석－중분해능 오제 전자 분광기－원소 분석을 위한 에너지 눈금 교정
表面化学分析中分辨率俄歇电子能谱仪元素分析用能标的校准

2011-12-30

现行

KS D ISO 17973(2021 Confirm)

표면 화학 분석－중분해능 오제 전자 분광기－원소 분석을 위한 에너지 눈금 교정
表面化学分析——中分辨率俄歇电子光谱仪——元素分析用能标的校准

2011-12-30

现行

ISO 17973-2024

Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
表面化学分析中分辨俄歇电子能谱仪元素分析能标的校准

2024-07-03

现行

BS ISO 17973-2016

Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
表面化学分析 中分辨率俄歇电子光谱仪 元素分析用能量标度的校准

2016-09-30

现行

KS D ISO 17974(2016 Confirm)

표면 화학 분석－고분해능 오제 전자 분광기－원소 및 화학 상태 분석을 위한 에너지 눈금 교정
表面化学分析高分辨率俄歇电子能谱仪元素和化学状态分析用能标的校准

2011-12-30

现行

KS D ISO 17974(2021 Confirm)

표면 화학 분석－고분해능 오제 전자 분광기－원소 및 화학 상태 분석을 위한 에너지 눈금 교정
表面化学分析——高分辨率俄歇电子光谱仪——元素和化学状态分析用能标的校准

2011-12-30

现行

ISO 17974-2002

Surface chemical analysis — High-resolution Auger electron spectrometers — Calibration of energy scales for elemental and chemical-state analysis
表面化学分析——高分辨率俄歇电子能谱仪——元素和化学状态分析用能量标度的校准

2002-10-17

现行

BS ISO 17974-2002

Surface chemical analysis. High-resolution Auger electron spectrometers. Calibration of energy scales for elemental and chemical-state analysis
表面化学分析 高分辨率俄歇电子光谱仪 元素和化学状态分析用能量标度的校准

2002-11-29

现行

AS ISO 17974-2006

Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
表面化学分析.高分辨率俄歇电子光谱仪.元素和化学状态分析用能标的校准

2006-10-20

现行

GB/T 29731-2013

表面化学分析 高分辨俄歇电子能谱仪 元素和化学态分析用能量标校准
Surface chemical analysis - High resolution auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis

2013-09-18

现行

KS D ISO 21270(2020 Confirm)

표면 화학 분석－X선 광전자 및 오제 전자 분광계－세기 눈금의 직선성
表面化学分析X射线光电子能谱仪和俄歇电子能谱仪强度标度的线性

2005-12-28

现行

ISO 21270-2004

Surface chemical analysis — X-ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
表面化学分析——X射线光电子能谱仪和俄歇电子能谱仪——强度标度线性

2004-06-15

现行

BS ISO 21270-2004

Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
表面化学分析 X射线光电子能谱仪和俄歇电子能谱仪 强度标度的线性

2005-03-31

现行

GB/T 21006-2007

表面化学分析 X射线光电子能谱仪和俄歇电子能谱仪 强度标的线性
Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale

2007-07-31

现行

BS ISO 18516-2006

Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution
表面化学分析 俄歇电子能谱和X射线光电子能谱 横向分辨率的测定

2006-11-30

现行

GB/T 28632-2012

表面化学分析 俄歇电子能谱和X射线光电子能谱 横向分辨率测定
Surface chemical analysis － Auger electron spectroscopy and X-ray photoelectron spectroscopy － Determination of lateral resolution

2012-07-31

现行

KS D ISO 19319(2020 Confirm)

표면 화학 분석－오제 전자 분광법과 X선 광전자 분광법－측면 분해능, 분석 영역,분석기로 측정한 시료 범위의 결정
表面化学分析－俄歇电子能谱和X射线光电子能谱－分析仪横向分辨率、分析面积和样品面积的测定

2005-12-28

现行

GB/T 29556-2013

表面化学分析 俄歇电子能谱和X射线光电子能谱 横向分辨率、分析面积和分析器所能检测到的样品面积的测定
Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - determination of lateral resolution, analysis area, and sample area viewed by the analyser

2013-07-19