现行

GB/T 13973-2012

半导体管特性图示仪通用规范
General specification test methods for semiconductor device curve tracers

2012-12-31

现行

JJF 1236-2010

半导体管特性图示仪校准规范
Calibration Specification for Semiconductor Device Curve Tracers

2010-01-05

现行

DLS-MIL-STD-750F-2012

Test Methods For Semiconductor Devices
Test Methods For Semiconductor Devices

2012-01-03

现行

MIL MIL-STD-750F Change 2(all previous changes incorporated)

Test Methods for Semiconductor Devices
半导体器件的试验方法

2016-11-30

现行

MIL MIL-STD-750F Change 1(change incorporated)

Test Methods for Semiconductor Devices
半导体器件的试验方法

2013-04-29

现行

MIL MIL-STD-750F

Test Methods for Semiconductor Devices
半导体器件的试验方法

2011-01-03

现行

BS EN 60749-38-2008

Semiconductor devices. Mechanical and climatic test methods-Soft error test method for semiconductor devices with memory
半导体器件 机械和气候试验方法

2008-06-30

现行

IEC 60749-38-2008

Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
半导体器件 - 机械和气候测试方法 - 第38部分:具有存储器的半导体器件的软错误测试方法

2008-02-12

现行

KS C IEC 60749(2020 Confirm)

반도체 소자－기계 및 기후적 환경 시험 방법
半导体器件机械和气候试验方法

2004-08-13

现行

SJ/Z 9016-1987

半导体器件 机械和气候试验方法
Semiconductor devices--Mechanical and climatic test methods

1987-09-14

现行

GOST 28578-1990

Приборы полупроводниковые. Механические и климатические испытания
半导体器件 机械和气候试验方法

现行

GOST 24461-1980

Приборы полупроводниковые силовые. Методы измерений и испытаний
功率半导体器件 测试和测量方法

现行

BS IEC 62951-5-2019

Semiconductor devices. Flexible and stretchable semiconductor devices-Test method for thermal characteristics of flexible materials
半导体器件 柔性可伸缩半导体器件

2019-03-05

现行

BS IEC 62830-4-2019

Semiconductor devices. Semiconductor devices for energy harvesting and generation-Test and evaluation methods for flexible piezoelectric energy harvesting devices
半导体器件 用于能量收集和发电的半导体器件

2019-03-05

现行

IEC 63364-1-2022

Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection
半导体器件物联网系统用半导体器件第1部分:声音变化检测的试验方法

2022-12-14

现行

BS IEC 62951-6-2019

Semiconductor devices. Flexible and stretchable semiconductor devices-Test method for sheet resistance of flexible conducting films
半导体器件 柔性可伸缩半导体器件

2019-05-15

现行

BS EN 60749-44-2016

Semiconductor devices. Mechanical and climatic test methods-Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
半导体器件 机械和气候试验方法

2016-11-30

现行

SJ 2065-1982

半导体器件生产用扩散炉测试方法
Testing method for diffusion furnace for semiconductor device manufacturing

1982-02-18

现行

BS EN 60749-1-2003

Semiconductor devices. Mechanical and climatic test methods-General
半导体器件 机械和气候试验方法

2003-07-07

现行

BS EN 60749-21-2011

Semiconductor devices. Mechanical and climatic test methods-Solderability
半导体器件 机械和气候试验方法

2011-08-31