Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification

Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications

Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components

Electronic components - Long-term storage of electronic semiconductor devices - Part 9: Special cases

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level