本标准定义了一种测试描述语言: a） 有助于将大量数字测试向量数据从CAE环境传输到自动测试设备（ATE）环境； b） 指定模式、格式和时序信息，这些信息足以定义数字测试向量对被测设备（DUT）的应用； c） 支持结构化测试（如扫描/自动测试模式生成（ATPG）、集成测试技术（如内置自测试（BIST））以及IC设计及其组件的功能测试规范生成的测试向量数据量，其格式针对ATE环境中的应用进行了优化。 在设定任何标准的范围时，有些问题被定义为与初始项目无关。以下是从该初始项目范围中删除的部分问题列表: 电平:数字测试程序的一个关键方面是为被测信号建立电压和电流参数（电平）的能力。 当前标准中未明确定义液位处理，因为该信息既紧凑（不存在运输问题），又通常独立于数字测试数据建立，需要本标准当前范围之外的不同支持机制。终止值可能会影响级别。 诊断/故障跟踪信息:本标准的目标是以最佳方式呈现需要移动到ATE上的数据。虽然诊断数据、故障识别数据和宏/设计元素对应数据可以属于这一类（通常相当大），但本标准也侧重于集成电路和组件测试，大多数调试/故障分析与这些结构的ATE分开进行。请注意，故障信息的返回（用于非ATE分析）也不是当前定义的标准的一部分。 数据记录机制、格式和控制通常不被定义为当前版本的一部分 标准 参数测试不被定义为本标准的组成部分，但用于识别参数测试潜在位置的可选模式标签除外，如IDDQ测试或交流（AC）定时测试。 ？程序流程:测试顺序和顺序未定义为当前标准的一部分，除非有必要定义作为一个单元执行的数字模式集合。 装箱构造不是当前标准的一部分。 模拟或混合信号测试:虽然这是许多参与者关心的一个领域，但在这一点上 模拟测试数据的传输不会导致与数字数据相同的传输问题。 算法模式构造（例如通常用于记忆测试的序列）目前还不存在 定义为标准的一部分。 并行测试/多站点测试结构不是当前环境的组成部分。 用户输入和用户控制/选项不是当前标准的一部分。 特征化工具，如shmoo图，未定义为当前标准的一部分。

This standard defines a test description language that: a) Facilitates the transfer of large volumes of digital test vector data from CAE environments to automated test equipment (ATE) environments; b) Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); c) Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments. In setting the scope for any standard, some issues are defined to not be pertinent to the initial project. The following is a partial list of issues that were dropped from the scope of this initial project: — Levels: A key aspect of a digital test program is the ability to establish voltage and current parameters (levels) for signals under test. Level handling is not explicitly defined in the current standard, as this information is both compact (not presenting a transportation issue) and commonly established independently of digital test data, requiring different support mechanisms outside the current scope of this standard. Termination values may affect levels. — Diagnostic/fault-tracing information: The goal of this standard is to optimally present data that needs to be moved onto ATE. While diagnostic data, fault identification data, and macro/design element correspondence data can fall into this category (and is often fairly large), this standard is also focused on integrated circuit and assemblies test, and most debug/failure analysis occurs separately from the ATE for these structures. Note that return of failure information (for off-ATE analysis) is also not part of the standard as currently defined. — Datalogging mechanisms, formatting, and control usually are not defined as part of this current standard. — Parametric tests are not defined as an integral part of this standard, except for optional pattern labels that identify potential locations for parametric tests, such as IDDQ tests or alternating current (AC) timing tests. — Program flow: Test sequencing and ordering are not defined as part of the current standard except as necessary to define collections of digital patterns meant to execute as a unit. — Binning constructs are not part of the current standard. — Analog or mixed-signal test: While this is an area of concern for many participants, at this point transfer of analog test data does not contribute to the same transportation issue seen with digital data. — Algorithmic pattern constructs (such as sequences commonly used for memory test) are not currently defined as part of the standard. — Parallel test/multisite test constructs are not an integral part of the current environment. — User input and user control/options are not part of the current standard. — Characterization tools, such as shmoo plots, are not defined as part of the current standard.