IEC 60747-14-4:20 11适用于所有类型产品的半导体加速度计。本标准不仅适用于带有内置电路的典型半导体加速度计，也适用于带有外部电路的半导体加速度计。本标准不（或不应）违反（或干扰）客户和供应商之间关于业务新模型或参数的协议。 注1:本标准虽然针对半导体加速度计，但可全部或部分适用于任何量产类型的加速度计。 注2:本标准的目的是允许系统描述，涵盖半导体加速度计出现所引发的主题。强加给半导体加速度计的任务不仅是所有加速度计共有的，而且是它们固有的并且尚未完全解决。这些描述基于最新的研究结果。一个典型的例子是多轴加速度计。本标准规定了使用多轴加速度计测量矢量加速度的方法。 注3:本标准与ISO 16063或ISO 5347的任何现有部分没有任何冲突。本标准旨在提供半导体多轴加速度计的校准概念和程序，这些加速度计不仅用于加速度的测量，还用于从DC到DC的宽频率范围内的运动控制。 本出版物应与IEC 60747-1:20 06一起阅读。

IEC 60747-14-4:2011 applies to semiconductor accelerometers for all types of products. This standard applies not only to typical semiconductor accelerometers with built-in electric circuits, but also to semiconductor accelerometers accompanied by external circuits. This standard does not (or should not) violate (or interfere with) the agreement between customers and suppliers in terms of a new model or parameters for business.
NOTE 1: This standard, although directed toward semiconductor accelerometers, may be applied in whole or in part to any mass produced type of accelerometer.
NOTE 2: The purpose of this standard is to allow for a systematic description, which covers the subjects initiated by the advent of semiconductor accelerometers. The tasks imposed on the semiconductor accelerometers are not only common to all accelerometers but also inherent to them and not yet totally solved. The descriptions are based on latest research results. One typical example is the multi-axis accelerometer. This standard states the method of measuring acceleration as a vector quantity using multi-axis accelerometers.
NOTE 3: This standard does not conflict in any way with any existing parts of either ISO 16063 or ISO 5347. This standard intends to provide the concepts and the procedures of calibration of the semiconductor multi-axis accelerometers which are used not only for the measurement of acceleration but also for the control of motion in the wide frequencies ranging from DC.

This publication is to be read in conjunction with IEC 60747-1:2006.