Mechanical standardization of semiconductor devices - Part 6-19: Measurement methods of the package warpage at elevated temperature and the maximum permissible warpage (IEC 60191-6-19:2010); German version EN 60191-6-19:2010
半导体器件的机械标准化.第6-19部分:高温下封装翘曲和最大允许翘曲的测量方法(IEC 60191-6-19-2010);德文版EN 60191-6-19:2010