该方法概述了与应用设计恢复检测假冒电子部件相关的要求、能力和限制，包括:操作员培训；样品制备；成像技术；数据解释；设计/功能匹配；设备维护和保养；数据报告。该方法主要用于通过电路延迟和扫描电子显微镜或光学显微镜成像进行分析；然而，许多概念适用于其他显微镜和探测技术，以恢复设计数据。该方法的目的不是制造设备的副本，而是比较图像或恢复设计以确定真实性。 如果合同中引用了AS6171/11，则基础文件AS6171一般要求也应适用。

This method outlines the requirements, capabilities, and limitations associated with the application of Design Recovery for the detection of counterfeit electronic parts including: Operator training; Sample preparation; Imaging techniques; Data interpretation; Design/functional matching; Equipment maintenance and; Reporting of data. The method is primarily aimed at analyses performed by circuit delayering and imaging with a scanning electron microscope or optical microscope; however, many of the concepts are applicable to other microscope and probing techniques to recover design data. The method is not intended for the purpose of manufacturing copies of a device, but rather to compare images or recover the design for determination of authenticity.If AS6171/11 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.