首页 馆藏资源 舆情信息 标准服务 科研活动 关于我们
现行 DID DI-PSSS-82101
到馆提醒
收藏跟踪
购买正版
TRAINING REQUIREMENTS ANALYSIS REPORT (TRAR) 培训需求分析报告(TRAR)
发布日期: 2017-02-15
培训需求分析报告(TRAR)记录了目标人群/入门技能分析和所需技能/知识分析的结果。TRAR用于确定培训系统(TS)的最基本培训要求,并满足机组人员、维修人员和地面人员工作绩效要求(JPR)。
The Training Requirements Analysis Report (TRAR) documents the results of the target population/entry skills analysis and the required skills/knowledge analysis. The TRAR is used to establish the most basic level of training requirements for a Training System (TS) and satisfy aircrew, maintenance and ground personnel Job Performance Requirements (JPRs).
分类信息
发布单位或类别: 美国-数据项说明
关联关系
研制信息
相似标准/计划/法规
现行
DID DI-PSSS-82102
TRAINING SYSTEM BASIS ANALYSIS REPORT (TSBAR)
培训系统基础分析报告(TSBAR)
2017-02-15
现行
DID DI-ATTS-81271
TESTABILITY REQUIREMENTS ANALYSIS REPORT (SUPERSEDING DI-T-7199)
可测试性需求分析报告(取代DI-T-7199)
1992-06-12
现行
AIAA S-102.1.4-2019
Performance-Based Failure Reporting, Analysis & Corrective Action System (FRACAS) Requirements
基于性能的故障报告、分析和纠正措施系统(FRACAS)要求
2019-05-14
现行
DID DI-PSSS-82025
RELIABILITY-CENTERED MAINTENANCE (RCM) INACTIVE EQUIPMENT MAINTENANCE (IEM) REQUIREMENT ANALYSIS REPORT
以可靠性为中心的维修(RCM)非活动设备维修(IEM)需求分析报告
2016-01-28
现行
BS ISO 19830-2015
Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
表面化学分析 电子光谱 X射线光电子能谱峰拟合的最低报告要求
2015-11-30
现行
ISO 19830-2015
Surface chemical analysis — Electron spectroscopies — Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
表面化学分析 - 电子光谱 - X射线光电子能谱峰值拟合的最低报告要求
2015-11-05
现行
GB/T 41073-2021
表面化学分析 电子能谱 X射线光电子能谱峰拟合报告的基本要求
Surface chemical analysis—Electron spectroscopies—Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
2021-12-31
现行
BS ISO 16413-2020
Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
通过X射线反射计评估薄膜的厚度、密度和界面宽度 仪器要求、校准和定位、数据收集、数据分析和报告
2020-08-18
现行
KS D ISO 16413
X-선 반사율(XRR) 측정법을 이용한 박막의 두께, 밀도, 계면 너비 평가 — 장치 요건, 정렬 및 위치결정, 데이터 수집, 데이터 분석, 보고
用X射线反射计评估薄膜的厚度、密度和界面宽度.仪器要求、校准和定位、数据收集、数据分析和报告
2021-07-16
现行
GB/T 36053-2018
X射线反射法测量薄膜的厚度、密度和界面宽度 仪器要求、准直和定位、数据采集、数据分析和报告
Evaluation of thickness, density and interface width of thin films by X-ray reflectometry—Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
2018-03-15
现行
ISO 16413-2020
Evaluation of thickness, density and interface width of thin films by X-ray reflectometry — Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
通过X射线反射法评估薄膜的厚度 密度和界面宽度 - 仪器要求 对准和定位 数据采集 数据分析和报告
2020-08-14
现行
BS ISO 20903-2019
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
表面化学分析 俄歇电子能谱和X射线光电子能谱 报告结果时用于确定峰值强度和所需信息的方法
2019-02-15
现行
ISO 20903-2019
Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting results
表面化学分析 - 俄歇电子光谱和X射线光电子能谱 - 用于确定峰值强度的方法和报告结果时所需的信息
2019-02-13
现行
GB/T 28893-2024
表面化学分析 俄歇电子能谱和X射线光电子能谱 测定峰强度的方法和报告结果所需的信息
Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Methods used to determine peak intensities and information required when reporting results
2024-03-15