本测试方法标准的第1部分为半导体器件的基本环境测试建立了统一的测试方法，以确定其对自然元素和军事行动周围条件的有害影响的抵抗力。就本试验方法标准而言，术语“器件”包括晶体管、二极管、电压调节器、整流器、隧道二极管和其他相关部件。多部分测试方法标准的这一部分旨在仅适用于半导体器件。

Part 1 of this test method standard establishes uniform test methods for the basic environmental testing of semiconductor devices to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this test method standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This part of a multipart test method standard is intended to apply only to semiconductor devices.