首页 馆藏资源 舆情信息 标准服务 科研活动 关于我们
现行 IEC 61967-4:2021 RLV
到馆提醒
收藏跟踪
购买正版
Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method 集成电路电磁发射的测量第4部分:传导发射的测量1欧姆/150欧姆直接耦合法
发布日期: 2021-03-16
IEC 61967-4:20 21 RLV包含官方IEC国际标准及其红线版本。Redline版本仅提供英文版本,为您提供了一种快速简单的方法来比较IEC官方标准与其以前版本之间的所有变化。 IEC 61967-4:20 21规定了一种测量集成电路传导电磁辐射(EME)的方法,该方法通过使用1 Ω电阻探头直接射频(RF)电流测量和使用150?耦合网络。这些方法确保了EME测量结果的高度再现性和相关性。与上一版相比,此版本包括以下重大技术变更: -从标题中删除了150 kHz至1 GHz的频率范围; -1的推荐频率范围?方法已降低到30 MHz; -增加了附件G,其中载有将频率范围扩展到1 GHz以上的建议和准则。
IEC 61967-4:2021 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition.

IEC 61967-4:2021 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe and RF voltage measurement using a 150?coupling network. These methods ensure a high degree of reproducibility and correlation of EME measurement results. This edition includes the following significant technical changes with respect to the previous edition:
- frequency range of 150 kHz to 1 GHz has been deleted from the title;
- recommended frequency range for 1?method has been reduced to 30 MHz;
- Annex G with recommendations and guidelines for frequency range extension beyond 1 GHz has been added.
分类信息
关联关系
研制信息
归口单位: TC 47/SC 47A
相似标准/计划/法规
现行
IEC 61967-8-2023 RLV
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
集成电路.电磁发射的测量.第8部分:辐射发射的测量.IC带状线法
2023-05-03
现行
IEC 61967-8-2023
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
集成电路.电磁发射的测量.第8部分:辐射发射的测量.IC带状线法
2023-05-03
现行
IEC TS 61967-3-2014
Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
集成电路.电磁发射的测量.第3部分:辐射发射的测量.表面扫描法
2014-08-25
现行
BS EN IEC 61967-1-2019
Integrated circuits. Measurement of electromagnetic emissions-General conditions and definitions
集成电路 电磁辐射的测量 一般条件和定义
2019-02-21
现行
IEC 61967-1-2018
Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
集成电路电磁辐射测量第1部分:一般条件和定义
2018-12-12
现行
IEC 61967-1-2018 RLV
Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
集成电路.电磁辐射的测量.第1部分:一般条件和定义
2018-12-12
现行
SJ 21147.3-2016
军用集成电路电磁发射测量方法 第3部分:辐射发射测量-表面扫描法
Measurement of electromagnetic emissions for military integrated circuits - Part 3:Measurement of radiated emissions - Surface scan method
2016-01-19
现行
SJ 21147.1-2016
军用集成电路电磁发射测量方法 第1部分:通用条件和定义
Measurement of electromagnetic emissions for military integrated circuits - Part 1:General conditions and definitions
2016-01-19
现行
SJ 21147.5-2016
军用集成电路电磁发射测量方法 第5部分:传导发射测量-工作台法拉第笼法
Measurement of electromagnetic emissions for military integrated circuits - Part 5:Measurement of conducted emissions - Workbench Faraday Cage method
2016-01-19
现行
SJ 21147.4-2016
军用集成电路电磁发射测量方法 第4部分:传导发射测量 - 1Ω/150Ω直接耦合法
Measurement of electromagnetic emissions for military integrated circuits - Part 4:Measurement of conducted emissions - 1Ω/150Ω direct coupling method
2016-01-19
现行
IEC 61967-6-2002
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
集成电路 - 电磁辐射测量 150赫兹至1 Ghz - 第6部分:传导发射测量 - 磁探针法
2002-06-25
现行
SJ 21147.2-2016
军用集成电路电磁发射测量方法 第2部分:辐射发射测量-TEM小室和宽带TEM小室法
Measurement of electromagnetic emissions for military integrated circuits - Part 2:Measurement of radiated emissions - TEM cell and wideband TEM cell method
2016-01-19
现行
IEC 61967-4-2021
Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
集成电路电磁发射测量第4部分:1欧姆/150欧姆直接耦合法测量传导发射
2021-03-16
现行
IEC 61967-6-2002+AMD1-2008 CSV
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
集成电路.150kHz至1GHz电磁发射的测量.第6部分:传导发射的测量.磁探针法
2008-06-24
现行
BS EN IEC 61967-4-2021
Integrated circuits. Measurement of electromagnetic emissions-Measurement of conducted emissions. 1 Ω/150 Ω direct coupling method
集成电路 电磁辐射测量
2021-05-06
现行
DIN IEC/TS 61967-3
Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method (IEC/TS 61967-3:2014)
集成电路.电磁发射的测量.第3部分:辐射发射的测量.表面扫描法(IEC/TS 61967-3-2014)
2015-08-01
现行
BS EN 61967-5-2003
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz-Measurement of conducted emissions. Workbench Faraday Cage method
集成电路 电磁辐射测量 150 kHz至1 GHz
2003-06-17
现行
IEC 61967-6-2002/AMD1-2008
Amendment 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
修改件1.集成电路.150 kHz至1 GHz电磁发射的测量.第6部分:传导发射的测量.磁探针法
2008-03-12
现行
IEC 61967-2-2005
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
集成电路 - 电磁辐射测量 150 Khz至1 Ghz - 第2部分:辐射辐射测量 - 温度计和宽带温度计方法
2005-09-29
现行
DIN IEC 61967-8-DRAFT
Draft Document - Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC Stripline method (IEC 47A/810/CD:2009)
文件草案——集成电路——电磁发射测量——第8部分:辐射发射测量——IC带状线法(IEC 47A/810/CD:2009)
2009-05-01