现行

IEC 62132-1-2015

Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
集成电路 - 电磁抗扰度测量 - 第1部分:一般条件和定义

2015-10-29

现行

IEC 61967-1-2018

Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
集成电路电磁辐射测量第1部分:一般条件和定义

2018-12-12

现行

IEC 61967-1-2018 RLV

Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
集成电路.电磁辐射的测量.第1部分:一般条件和定义

2018-12-12

现行

GB/T 42968.1-2023

集成电路 电磁抗扰度测量 第1部分：通用条件和定义
Integrated circuits—Measurement of electromagnetic immunity—Part 1: General conditions and definitions

2023-09-07

现行

SJ 21147.1-2016

军用集成电路电磁发射测量方法 第1部分：通用条件和定义
Measurement of electromagnetic emissions for military integrated circuits - Part 1:General conditions and definitions

2016-01-19

现行

BS 12/30268333 DC

BS EN 62132-1. Integrated circuits. Measurement of electromagnetic immunity. General conditions and definitions
英国标准EN 62132-1 集成电路 电磁抗扰度的测量 一般条件和定义

2012-07-11

现行

BS EN IEC 61967-4-2021

Integrated circuits. Measurement of electromagnetic emissions-Measurement of conducted emissions. 1 Ω/150 Ω direct coupling method
集成电路 电磁辐射测量

2021-05-06

现行

BS EN 62132-5-2006

Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz-Workbench Faraday cage method
集成电路 电磁抗扰度测量 150 kHz至1 GHz

2006-03-31

现行

BS EN 61967-5-2003

Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz-Measurement of conducted emissions. Workbench Faraday Cage method
集成电路 电磁辐射测量 150 kHz至1 GHz

2003-06-17

现行

BS EN 62132-4-2006

Integrated circuits. Measurement of electromagnetic immunity. 150 kHz to 1 GHz-Direct RF power injection method
集成电路 电磁抗扰度的测量 150千赫至1千兆赫

2006-07-31

现行

BS EN 62132-3-2007

Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz-Bulk current injection (BCI) method
集成电路 电磁抗扰度测量 150 kHz至1 GHz

2007-11-30

现行

IEC 61967-4-2021 RLV

Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
集成电路电磁发射的测量第4部分:传导发射的测量1欧姆/150欧姆直接耦合法

2021-03-16

现行

IEC 61967-6-2002

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
集成电路 - 电磁辐射测量 150赫兹至1 Ghz - 第6部分:传导发射测量 - 磁探针法

2002-06-25

现行

IEC 61967-4-2021

Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
集成电路电磁发射测量第4部分:1欧姆/150欧姆直接耦合法测量传导发射

2021-03-16

现行

IEC 61967-6-2002+AMD1-2008 CSV

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
集成电路.150kHz至1GHz电磁发射的测量.第6部分:传导发射的测量.磁探针法

2008-06-24

现行

IEC 62132-5-2005

Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method
集成电路 - 电磁抗扰度测量 150 Khz至1 Ghz - 第5部分:工作台法拉第笼式

2005-10-10

现行

IEC TR 61967-1-1-2015

Integrated circuits - Measurement of electromagnetic emissions - Part 1-1: General conditions and definitions - Near-field scan data exchange format
集成电路.电磁发射的测量.第1-1部分:一般条件和定义.近场扫描数据交换格式

2015-08-28

现行

BS EN 61967-2-2005

Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz-Measurement of radiated emissions. TEM cell and wideband TEM cell method
集成电路 电磁辐射测量 150 kHz至1 GHz

2006-01-23

现行

IEC 62132-4-2006

Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
集成电路 - 电磁抗扰度测量150 Khz至1 Ghz - 第4部分:直接Rf功率注入法

2006-02-21

现行

KS C IEC 61967-4(2019 Confirm)

집적 회로－150 kHz에서 1 GHz의 전기 자기 장해 측정－제4부：전도 장해 측정－1 W/150 W 직접 결합 방법
集成电路150kHz～1GHz电磁发射测量第4部分:传导发射测量1W/150W直接耦合法

2004-11-30