KS C IEC 61967-4-2004(2019)-集成电路150kHz～1GHz电磁发射测量第4部分:传导发射测量1W/150W直接耦合法 -国家数字标准馆

现行 KS C IEC 61967-4-2004(2019)

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집적 회로－150 kHz에서 1 GHz의 전기 자기 장해 측정－제4부：전도 장해 측정－1 W/150 W 직접 결합 방법 集成电路150kHz～1GHz电磁发射测量第4部分:传导发射测量1W/150W直接耦合法

发布日期： 2004-11-30

该规格规定了利用150W耦合网络测量RF电压及用1W电阻探头直接测量RF电流，测量导电性电磁辐射（EME）的方法。这些方法保证了EME测量的高水平重复性和相关性。IEC61967-1规定了试验方法的定义及一般条件。

이 규격은 150 W 결합 네트워크를 이용한 RF 전압 측정 및 1 W 저항 프로브로 직접 RF 전류 측 정에 의 해 전도성 전기 자기 방사(EME)를 측정하기 위한 방법을 규정한다. 이러한 방법들은 EME 측정의 높 은 수준의 반복성 및 상관 관계를 보장한다. IEC 61967－1은 시험 방법의 정의 및 일반적 조건을 규정한다.

分类信息

发布单位或类别：韩国-韩国标准

ICS分类： 31.200电子学 - 集成电路、微电子学

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研制信息

相似标准/计划/法规

BS EN 61967-5-2003

Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz-Measurement of conducted emissions. Workbench Faraday Cage method
集成电路电磁辐射测量 150 kHz至1 GHz

IEC 61967-6-2002

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
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IEC 61967-6-2002+AMD1-2008 CSV

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
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BS EN 61967-2-2005

Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz-Measurement of radiated emissions. TEM cell and wideband TEM cell method
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IEC 61967-6-2002/AMD1-2008

Amendment 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
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IEC 61967-2-2005

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
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BS EN 62132-5-2006

Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz-Workbench Faraday cage method
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BS EN IEC 61967-4-2021

Integrated circuits. Measurement of electromagnetic emissions-Measurement of conducted emissions. 1 Ω/150 Ω direct coupling method
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BS EN 62132-4-2006

Integrated circuits. Measurement of electromagnetic immunity. 150 kHz to 1 GHz-Direct RF power injection method
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BS EN 62132-3-2007

Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz-Bulk current injection (BCI) method
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IEC TR 61967-4-1-2005

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4-1: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method - Application guidance to IEC 61967-4
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IEC 62132-5-2005

Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method
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IEC 61967-4-2021 RLV

Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
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IEC 61967-4-2021

Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
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IEC 62132-4-2006

Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
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BS EN IEC 61967-1-2019

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IEC 61967-8-2023 RLV

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
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IEC 61967-8-2023

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IEC TS 61967-3-2014

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