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现行 IEC TR 61967-4-1:2005
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Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4-1: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method - Application guidance to IEC 61967-4 集成电路.150kHz至1GHz电磁发射的测量.第4-1部分:传导发射的测量.1&Omega/150&ω;直接耦合法.IEC 61967-4的应用指南
发布日期: 2005-02-07
作为应用指南,与IEC 61967-4相关。将IC类型划分为->IC功能模块和->带CPU的内核的软件模块可用于IEC 61967的第3、5和6部分。通过对集成电路(IC)类型进行分类,并为与IC类型分类相关的测试应用提供提示,为执行IEC 61967-4中描述的测试方法提供建议。 为了获得使用IEC 61967-4的IC发射测量的可比结果,给出了除IEC 61967-1和IEC 61967-4中规定的一般条件之外的定义。这些定义涉及IC相关的工作模式、待测引脚和端口、根据IEC 61967-4的测试设置,包括负载电路和RF路径的描述,以及IC相关的发射限值(或限值等级)。本技术报告提供的部分指导可能适用于IEC 61967的其他部分。
Serves as an application guidance and relates to IEC 61967-4. The division of IC types into -> IC function modules and the software modules for -> cores with CPU can be used for Parts 3, 5 and 6 of IEC 61967. Gives advice for performing test methods described in IEC 61967-4 by classifying types of integrated circuits (ICs) and providing hints for test applications related to the IC type classification. To obtain comparable results of IC emission measurements using IEC 61967-4, definitions are given which are in addition to the general conditions specified in IEC 61967-1 and IEC 61967-4. These definitions concern IC related operating modes, pins and ports to be tested, test set-ups according IEC 61967-4, including description of load circuits and RF path, and IC related emission limits (or limit classes). Parts of the guidance provided by this technical report may be applicable to other parts of IEC 61967.
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归口单位: TC 47/SC 47A
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