IEC 61967-6 Ed 1.1:2008规定了一种通过使用微型磁探针的非接触电流测量来评估集成电路(IC)引脚上的RF电流的方法。该方法能够在0.15 MHz至1000MHz的频率范围内测量由IC产生的RF电流。该方法适用于标准化测试板上的单个IC或IC芯片组的测量，用于表征和比较目的。它还可用于评估实际应用PCB上的IC或IC组的电磁特性，以达到减排目的。这种方法被称为“磁探针法”。 本合并版本由第一版（2002年）组成 及其修正案1（2008）。因此，无须在 本出版物的补充。

IEC 61967-6 Ed 1.1:2008 specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over a frequency range of 0,15 MHz to 1 000 MHz. This method is applicable to the measurement of a single IC or a chip set of ICs on the standardized test board for characterization and comparison purposes. It is also usable to evaluate the electromagnetic characteristics of an IC or group of ICs on an actual application PCB for emission reduction purposes. This method is called the "magnetic probe method". This consolidated version consists of the first edition (2002) and its amendment 1 (2008). Therefore, no need to order amendment in addition to this publication.