BS PD IEC/TS 62607-6-4:2016建立了一种测定二维导体表面电导的方法 （2D）单层或多层原子薄纳米碳石墨烯结构。 它们是通过化学气相沉积（CVD）在硅上外延生长而成 碳化物（SiC），从还原氧化石墨烯（rGO）中获得，或从中机械剥离 石墨[3]。测量是在充气标准R100矩形管中进行的 波导配置，在其中一个谐振频率模式下，通常为7 GHz[4]。通过谐振腔测量表面电导涉及到对谐振腔的监测 频率偏移和插入样品前后质量因数的变化 空腔与试样表面积存在定量相关性。这个测量 并不明确取决于纳米碳层的厚度。厚度 试样不需要已知，但假定横向尺寸是均匀的 在样本区域上方。交叉引用:IEC 60153-2购买时可用的所有现行修订均包含在本文件的购买中。

BS PD IEC/TS 62607-6-4:2016 establishes a method for determining the surface conductance of twodimensional (2D) single-layer or multi-layer atomically thin nano-carbon graphene structures. These are synthesized by chemical vapour deposition (CVD), epitaxial growth on silicon carbide (SiC), obtained from reduced graphene oxide (rGO) or mechanically exfoliated from graphite [3]. The measurements are made in an air filled standard R100 rectangular waveguide configuration, at one of the resonant frequency modes, typically at 7 GHz [4].Surface conductance measurement by resonant cavity involves monitoring the resonant frequency shift and change in the quality factor before and after insertion of the specimen into the cavity in a quantitative correlation with the specimen surface area. This measurement does not explicitly depend on the thickness of the nano-carbon layer. The thickness of the specimen does not need to be known, but it is assumed that the lateral dimension is uniform over the specimen area.Cross References:IEC 60153-2All current amendments available at time of purchase are included with the purchase of this document.