BS PD IEC TS 62607-6-3:2020-纳米制造关键控制特性-国家数字标准馆

现行 BS PD IEC TS 62607-6-3:2020

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Nanomanufacturing. Key control characteristics-Graphene-based material. Domain size: substrate oxidation 纳米制造关键控制特性

发布日期： 2020-11-02

IEC TS 62607的本部分建立了确定结构键的标准化方法
控制特性
-用化学气相沉积法（CVD）在铜衬底上通过氧化法生长石墨烯薄膜的磁畴尺寸。购买本文件时可获得的所有当前修订均包含在购买本文件中。

This part of IEC TS 62607 establishes a standardized method to determine the structural key
control characteristic
- domain sizefor films consisting of graphene grown by chemical vapour deposition (CVD) on copper by- substrate oxidation.All current amendments available at time of purchase are included with the purchase of this document.

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发布单位或类别：英国-英国标准学会

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