本文档介绍了可以访问的信息类型（以及一些示例） 使用表面分析工具获得关于纳米结构材料的信息（第5条）。同样重要的是， 与表征纳米结构材料相关的一般问题或挑战以及 确定了与个别方法相关的具体机遇或挑战（第6条）。像 物体或材料组件的大小接近几纳米，它们之间的区别 “体积”、“表面”和“粒子”分析模糊。虽然一些与人物塑造相关的一般性问题 如果确定了纳米结构材料的种类，本文件将重点讨论与 纳米结构材料的表面化学分析。 各种分析和表征 方法将被提及，但本报告侧重于ISO/TC 201范围内的方法 包括俄歇电子能谱、X射线光电子能谱、二次离子质量谱 光谱分析和扫描探针显微镜。纳米颗粒表面的几种测量方法 本报告不讨论溶液中经常产生的表面电位等性质。购买本文件时可获得的所有当前修订均包含在购买本文件中。

This document provides an introduction to (and some examples of) the types of information that can be obtained about nanostructured materials using surface-analysis tools (Clause 5). Of equal importance, both general issues or challenges associated with characterizing nanostructured materials and the specific opportunities or challenges associated with individual methods are identified (Clause 6). As the size of objects or components of materials approaches a few nanometres, the distinctions among "bulk", "surface" and "particle" analysis blur. Although some general issues relevant to characterization of nanostructured materials are identified, this document focuses on issues specifically relevant to surface chemical analysis of nanostructured materials. A variety of analytical and characterization methods will be mentioned, but this report focuses on methods that are in the domain of ISO/TC 201 including Auger Electron Spectroscopy, X-ray photoelectron spectroscopy, secondary ion mass spectrometry, and scanning probe microscopy. Some types of measurements of nanoparticle surface properties such as surface potential that are often made in a solution are not discussed in this Report.All current amendments available at time of purchase are included with the purchase of this document.