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现行 MIL MIL-PRF-19500/673A Amendment 1
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Transistor, Field Effect, Radiation Hardened N-Channel, Silicon, Encapsulated (Surface Mount and Carrier Board Packages), Types 2N7468 and 2N7469 JANTXVR, F, G and H and JANSR, F, G and H 晶体管 场效应 辐射硬化N沟道 硅 封装(表面安装和载板封装) 2N7468和2N7469型JANTCVR F G和H以及JANSR F、G和H
发布日期: 2009-11-05
本规范涵盖了N沟道、增强模式、MOSFET、辐射硬化(总剂量和单事件效应(SEE))、功率晶体管的性能要求。为每个封装器件提供两个级别的产品保证(JANTSV和JANS),具有雪崩能量最大额定值(Eas)和最大雪崩电流(Ias)。为JANS和JANTXV产品保证级别提供了四个辐射级别(“R”、“F”、“G”和“H”)的辐射硬度保证(RHA)规定。
This specification covers the performance requirements for an N-channel, enhancement-mode, MOSFET, radiation hardened (total dose and single event effects (SEE)), power transistor. Two levels of product assurance (JANTXV and JANS) are provided for each encapsulated device, with avalanche energy maximum rating (Eas) and maximum avalanche current (Ias). Provisions for radiation hardness assurance (RHA) to four radiation levels ("R", "F", "G" and "H") are provided for JANS and JANTXV product assurance levels.
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发布单位或类别: 美国-美国军事规范和标准
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