现行

BS ISO 16243-2011

Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
表面化学分析 X射线光电子能谱（XPS）中的数据记录和报告

2011-12-31

现行

ISO 16243-2011

Surface chemical analysis — Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
表面化学分析——X射线光电子能谱（XPS）中的数据记录和报告

2011-11-25

现行

BS 10/30199175 DC

BS ISO 16243. Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
BS ISO 16243 表面化学分析 X射线光电子能谱（XPS）中的数据记录和报告

2010-08-02

现行

GOST R ISO 16243-2016

Государственная система обеспечения единства измерений. Химический анализ поверхности. Рентгеновская фотоэлектронная спектроскопия. Регистрация и представление данных
确保测量一致性的状态系统 表面化学分析 在X射线光电子能谱（XPS）中记录和报告数据

现行

GB/T 36401-2018

表面化学分析　X射线光电子能谱　薄膜分析结果的报告
Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis

2018-06-07

现行

ISO 13424-2013

Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
表面化学分析——X射线光电子能谱；薄膜分析结果的报告

2013-09-23

现行

BS ISO 13424-2013

Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
表面化学分析 X射线光电子能谱 薄膜分析结果的报告

2013-10-31

现行

ISO 16242-2011

Surface chemical analysis — Recording and reporting data in Auger electron spectroscopy (AES)
表面化学分析——俄歇电子能谱（AES）中数据的记录和报告

2011-11-25

现行

GB/T 32565-2016

表面化学分析 俄歇电子能谱（AES）数据记录与报告的规范要求
Surface chemical analysis—Recording and reporting data in Auger electron spectroscopy (AES)

2016-02-24

现行

GB/T 25185-2010

表面化学分析　X射线光电子能谱　荷电控制和荷电校正方法的报告
Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of methods used for charge control and charge correction

2010-09-26

现行

KS D ISO 19318(2020 Confirm)

표면 화학 분석－X선 광전자 분광법－전하 제어와 전하 교정에 사용하는 방법
表面化学分析X射线光电子能谱电荷控制和电荷校正方法报告

2005-12-28

现行

ISO 19668-2017

Surface chemical analysis — X-ray photoelectron spectroscopy — Estimating and reporting detection limits for elements in homogeneous materials
表面化学分析.X射线光电子能谱.均匀材料中元素的估计和报告检测限

2017-08-14

现行

ISO 19830-2015

Surface chemical analysis — Electron spectroscopies — Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
表面化学分析 - 电子光谱 - X射线光电子能谱峰值拟合的最低报告要求

2015-11-05

现行

ISO 19318-2021

Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of methods used for charge control and charge correction
表面化学分析 - X射线光电子能谱 - 报告用于充电控制和电荷校正的方法

2021-06-04

现行

AS ISO 19318-2006

Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of methods used for charge control and charge correction
表面化学分析.X射线光电子能谱.电荷控制和电荷校正方法的报告

2006-10-20

现行

BS ISO 19318-2021

Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
表面化学分析 X射线光电子能谱 报告用于充电控制和充电校正的方法

2021-06-16

现行

BS ISO 19668-2017

Surface chemical analysis. X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials
表面化学分析 X射线光电子能谱 评估和报告均质材料中元素的检测限

2017-09-18

现行

BS ISO 19830-2015

Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
表面化学分析 电子光谱 X射线光电子能谱峰拟合的最低报告要求

2015-11-30

现行

GB/T 41073-2021

表面化学分析 电子能谱 X射线光电子能谱峰拟合报告的基本要求
Surface chemical analysis—Electron spectroscopies—Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy

2021-12-31

现行

DIN ISO 16242

Surface chemical analysis - Recording and reporting data in Auger electron spectroscopy (AES) (ISO 16242:2011); Text in English
表面化学分析.俄歇电子能谱（AES）中数据的记录和报告（ISO 16242-2011）；英文文本

2020-05-01