Surface chemical analysis. Secondary ion mass spectrometry. Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
表面化学分析 二次离子质谱法 单离子计数动态二次离子质谱中饱和强度的校正方法
发布日期:
2018-03-14
BS ISO 20411:2018规定了一种方法,用于确定脉冲计数磁扇形二次离子质谱仪或四极二次离子质谱仪中强度标度线性偏离可接受极限的最大计数率。它使用了一种基于深度剖面分析的测试方法,该方法对参考物质中的两种同位素进行了深度剖面分析,参考物质的浓度在低浓度和高浓度之间逐渐变化。它还包括由探测器死区时间引起的饱和强度的校正方法。校正可增加95%线性度的强度范围,因此,对于相关校正方程已被证明有效的光谱仪,可采用更高的最大计数率。本文件不适用于飞行时间质谱仪。本文件仅适用于含少量同位素的元素。如果该元素为单同位素或含有同等丰度的同位素,则不适用。
交叉引用:ISO 18115-2ISO 18115-1购买本文件时可获得的所有现行修订均包含在购买本文件中。
BS ISO 20411:2018 specifies a method for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale in pulse counting magnetic sector-type secondary ion mass spectrometers or quadrupole secondary ion mass spectrometers. It uses a test based on depth profile analysis of two isotopes in a reference material which has a gradual concentration change between low and high concentration regimes. It also includes a correction method for saturated intensity caused by the dead time of the detector. The correction can increase the intensity range for 95 % linearity so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction equations have been shown to be valid.This document does not apply to time of flight mass spectrometers.This document is only applicable to elements with minor isotopes. It is not applicable if the element is monoisotopic or contains isotopes with equal abundances.Cross References:ISO 18115-2ISO 18115-1All current amendments available at time of purchase are included with the purchase of this document.