ISO 17862:2014规定了在单离子计数飞行时间（TOF）二次离子质谱仪中，使用基于聚四氟乙烯（PTFE）光谱中同位素比率的测试，确定强度标度线性偏离可接受极限的最大计数率的方法。它还包括一种校正因微通道板（MCP）或闪烁体和光电倍增管的强度损失而产生的强度非线性的方法，随后是一个时间-数字转换器（TDC）检测系统，该系统由二次离子在死区时间内到达而引起。校正可将95%线性的强度范围增加50倍以上，因此，对于已证明相关校正公式有效的光谱仪，可采用更高的最大计数率。ISO 17862:2014还可用于确认死者死亡的仪器的有效性- 已经进行了时间修正，但可以或不可能进一步增加。

ISO 17862:2014 specifies a method for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale in single ion counting time-of-flight (TOF) secondary ion mass spectrometers using a test based on isotopic ratios in spectra from poly(tetrafluoroethylene) (PTFE). It also includes a method to correct for intensity nonlinearity arising from intensity lost from a microchannel plate (MCP) or scintillator and photomultiplier followed by a time-to-digital converter (TDC) detection system caused by secondary ions arriving during its dead-time. The correction can increase the intensity range for 95 % linearity by a factor of up to more than 50 so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction formulae have been shown to be valid. ISO 17862:2014 can also be used to confirm the validity of instruments in which the dead-time correction is already made but in which further increases can or cannot be possible.