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现行 IEC 62047-3:2006
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Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing 半导体器件 - 微机电器件 - 第3部分:薄膜标准试件用于拉伸试验
发布日期: 2006-08-15
规定了一种标准试件,用于保证长度和宽度小于1 mm、厚度小于10 m的薄膜材料拉伸测试系统的适当性和准确性,这些材料是微电子机械系统(MEMS)、微机械和类似设备的主要结构材料。 它基于这样一个概念,即当拉伸强度预先确定的标准试样的测量拉伸强度在指定范围内时,可以保证拉伸试验系统的适当性和准确性。它还规定了试件,以尽量减少试件之间的特性偏差。
Specifies a standard test piece, which is used to guarantee the propriety and accuracy of a tensile testing system for thin film materials with length and width under 1 mm and thickness under 10 m, which are main structural materials for microelectromechanical systems (MEMS), micromachines and similar devices. It is based on such a concept that a tensile testing system can be guaranteed in propriety and accuracy, when the measured tensile strengths of the standard test pieces, whose tensile strength is pre-determined, are within the designated range. It also specifies the test pieces to minimize characteristics deviation among the pieces.
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归口单位: TC 47/SC 47F
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